A simple wet etch for GaN

Citation
Ja. Bardwell et al., A simple wet etch for GaN, J ELEC MAT, 28(10), 1999, pp. L24-L26
Citations number
10
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
JOURNAL OF ELECTRONIC MATERIALS
ISSN journal
03615235 → ACNP
Volume
28
Issue
10
Year of publication
1999
Pages
L24 - L26
Database
ISI
SICI code
0361-5235(199910)28:10<L24:ASWEFG>2.0.ZU;2-5
Abstract
A simple UV photo-enhanced wet etch has been developed for GaN. Unlike phot oelectrochemical wet etching, this technique does not require an electrical contact to be made to the sample, and nitrides deposited on insulating sub strates (such as sapphire) can be etched. The technique relies on adding an appropriate oxidizing agent, in this case, peroxydisulfate to KOH solution s. Maximum etch rates are observed at pH 12.4. The etch rate increases line arly with Light intensity at 365 nm up to intensities of 25 mW/cm(2), where etch rates of up to 50 nm/min are observed.