Influence of smectic layer structure on electric field-induced migration of SiO2 particles

Authors
Nakayama, K Ozaki, M Yoshino, K
Citation
K. Nakayama et al., Influence of smectic layer structure on electric field-induced migration of SiO2 particles, MOL CRYST A, 329, 1999, pp. 741-747
Citations number
6
Categorie Soggetti
Physical Chemistry/Chemical Physics
Journal title
MOLECULAR CRYSTALS AND LIQUID CRYSTALS SCIENCE AND TECHNOLOGY SECTION A-MOLECULAR CRYSTALS AND LIQUID CRYSTALS
ISSN journal
1058725X → ACNP
Volume
329
Year of publication
1999
Part
2
Pages
741 - 747
Database
ISI
SICI code
1058-725X(1999)329:<741:IOSLSO>2.0.ZU;2-3
Abstract
The migration of SiO2 particles under the application of an ac electric fie ld has been observed in the various phases. SiO2 particles in the Iso. and N* phases migrated in a circle. In the SmA and SmC* phases, SiO2 particles migrated along the smectic layer. This indicates that the smectic layer str ucture influences the migration of SiO2 particles. The migration has been e xamined with a monodomain, a multidomain and a planar cell. The migration w as not observed in a homeotropic aligned region. The migration has been fou nd to require the polarity reversal of the applied electric field.