Application of solid immersion lens to submicron resolution imaging of nano-scale quantum wells

Authors
Baba, M Yoshita, M Sasaki, T Akiyama, H
Citation
M. Baba et al., Application of solid immersion lens to submicron resolution imaging of nano-scale quantum wells, OPT REV, 6(3), 1999, pp. 257-260
Citations number
13
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Optics & Acoustics
Journal title
OPTICAL REVIEW
ISSN journal
13406000 → ACNP
Volume
6
Issue
3
Year of publication
1999
Pages
257 - 260
Database
ISI
SICI code
1340-6000(199905/06)6:3<257:AOSILT>2.0.ZU;2-G
Abstract
We have discussed the resolution of submicron photoluminescence (PL) imagin g using a solid immersion lens (SIL), which collects an evanescent light he ld. We apply the SIL microscope to measure PL image of a strip-line-pattern ed GaAs quantum well structure at low temperature. An improved resolution b eyond diffraction limit and high collection efficiency of PL are realized.