Plasma doping: Progress and potential - Part two of two

Citation
Pk. Chu et al., Plasma doping: Progress and potential - Part two of two, SOL ST TECH, 42(10), 1999, pp. 77
Citations number
30
Categorie Soggetti
Eletrical & Eletronics Engineeing
Journal title
SOLID STATE TECHNOLOGY
ISSN journal
0038111X → ACNP
Volume
42
Issue
10
Year of publication
1999
Database
ISI
SICI code
0038-111X(199910)42:10<77:PDPAP->2.0.ZU;2-6
Abstract
Plasma doping is the leading candidate to replace today's beam-line ion imp lantation, which is being pushed to the limit by the need for ultra-shallow junctions. Cluster-compatible hardware is envisioned to provide simpler, m ore economical, higher-throughput wafer processing. Part one of this articl e, in the September issue of SST, reviewed the status of plasma doping, cit ed device data, and touched on process and equipment issues. Part two discu sses potential problems, including charge damage, equipment requirements, a nd economic factors.