Atomic force microscopy of in situ deformed nickel thin films

Citation
C. Coupeau et al., Atomic force microscopy of in situ deformed nickel thin films, THIN SOL FI, 353(1-2), 1999, pp. 194-200
Citations number
22
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
THIN SOLID FILMS
ISSN journal
00406090 → ACNP
Volume
353
Issue
1-2
Year of publication
1999
Pages
194 - 200
Database
ISI
SICI code
0040-6090(19990929)353:1-2<194:AFMOIS>2.0.ZU;2-Y
Abstract
The mechanical behaviour of thin metal films on substrate under stress and particularly the analysis of the first stage of buckling have been characte rized. Nickel/polycarbonate samples have been studied using a specific atom ic force microscopy which allows the observation in situ of the sample surf ace during deformation. Straight wrinkle-like shapes are induced in the Ni thin film above a critical stress perpendicular to the compression axis. Un dulations of very low amplitude appear also on these debonded regions. The dependence on stress of the shape of the straight wrinkles and of the undul ations is discussed. It is shown that theses experiments may be thought of as an alternative method to estimate the localised internal stress sigma(i) and the adhesion energy Gamma between the film and substrate. (C) 1999 Els evier Science S.A. All rights reserved.