High-resolution x-ray spectroscopy with superconducting tunnel junctions

Citation
P. Hettl et al., High-resolution x-ray spectroscopy with superconducting tunnel junctions, X-RAY SPECT, 28(5), 1999, pp. 309-311
Citations number
12
Categorie Soggetti
Spectroscopy /Instrumentation/Analytical Sciences
Journal title
X-RAY SPECTROMETRY
ISSN journal
00498246 → ACNP
Volume
28
Issue
5
Year of publication
1999
Pages
309 - 311
Database
ISI
SICI code
0049-8246(199909/10)28:5<309:HXSWST>2.0.ZU;2-B
Abstract
An energy resolution of Delta E = 12 eV (FWHM) was measured for the Mn-55 K alpha(1) line (E = 5.90 keV) using a single superconducting Al/AlxOy/Al tu nnel junction. The total detector area of 100 x 100 mu m was illuminated, w hile a slit mask of about 150 mu m width was used to shadow the detector le ads and substrate area from the impinging x-rays. The total electronic nois e contribution to the energy resolution was measured as Delta E-elec = 7 eV (FWHM). The process of tunnel junction fabrication was optimized towards a reproducible and high-quality growth of the tunnel barrier. High-quality a luminium films promote long quasi-particle lifetimes and ensure reproducibl e tunnel barrier growth. The residual resistance ratio of a 1 mu m thick al uminium test film was about 100, Copyright (C) 1999 John Wiley & Sons, Ltd.