Semiconductor drift detectors: Applications and new devices

Recent technological developments and new topology designs have made semico nductor drift detectors ideal devices for high-resolution g-ray spectrometr y. In this paper the basic topology of a semiconductor drift detector with on-chip electronics specially designed for x-ray spectrometry is reviewed. These devices have been used for the first time in x-ray and gamma-ray spec troscopy applications. In particular, the results obtained in non-destructi ve analyses by using a EDXRF spectrometer based on a Peltier cooled semicon ductor drift detector and in photodetection of scintillation light are repo rted. The working principle and the first experimental results for a novel position-sensitive x-ray detector with spectroscopic capability are present ed, Copyright (C) 1999 John Wiley & Sons, Ltd.