Hard x-ray microbeam production with synchrotron radiation: Application tomicroanalysis

Citation
P. Chevallier et al., Hard x-ray microbeam production with synchrotron radiation: Application tomicroanalysis, X-RAY SPECT, 28(5), 1999, pp. 348-351
Citations number
28
Categorie Soggetti
Spectroscopy /Instrumentation/Analytical Sciences
Journal title
X-RAY SPECTROMETRY
ISSN journal
00498246 → ACNP
Volume
28
Issue
5
Year of publication
1999
Pages
348 - 351
Database
ISI
SICI code
0049-8246(199909/10)28:5<348:HXMPWS>2.0.ZU;2-Q
Abstract
The advent of synchrotron radiation and the recent development of x-ray opt ics have rendered possible the realization of x-ray fluorescence microprobe s, Various arrangements allow one to obtain micrometer-size hard x-ray beam s with sufficient flux to undertake elemental mapping of trace elements. As sociated with micro-diffraction or with extended x-ray absorption fine stru cture studies, these microprobes are becoming very powerful tools for mater ial characterization. Copyright (C) 1999 John Wiley & Sons, Ltd.