The advent of synchrotron radiation and the recent development of x-ray opt
ics have rendered possible the realization of x-ray fluorescence microprobe
s, Various arrangements allow one to obtain micrometer-size hard x-ray beam
s with sufficient flux to undertake elemental mapping of trace elements. As
sociated with micro-diffraction or with extended x-ray absorption fine stru
cture studies, these microprobes are becoming very powerful tools for mater
ial characterization. Copyright (C) 1999 John Wiley & Sons, Ltd.