Cm. Wang et al., Atomic structural environment of grain boundary segregated Y and Zr in creep resistant alumina from EXAFS, ACT MATER, 47(12), 1999, pp. 3411-3422
Dopants Y and Zr at 100 p.p.m. level (Y or Zr to Al atomic ratio) in ultra-
high purity polycrystalline alumina have been found to be mainly segregated
to the alumina grain boundaries. The atomic structural environments around
the Y and Zr segregants have been investigated by Extended X-ray Absorptio
n Fine Structure (EXAFS), On average, Y ions in alpha-Al2O3 grain boundarie
s are coordinated by four oxygens, at a distance of 2.30 Angstrom, which co
rresponds nearly to the Y-O bond length in cubic Y2O3, and Zr ions are coor
dinated by five oxygens at a distance of 2.14 Angstrom, which is approximat
ely the same as the average Zr-O bond length in monoclinic ZrO2. However, i
n the EXAFS radial distribution function, the Y-cation and Zr-cation next n
earest neighbor shell cannot be clearly identified. These results suggest t
hat Y and Zr at 100 p.p.m. concentrations in alpha-Al2O3 occupy grain bound
ary sites with well defined nearest neighbor cation-oxygen bond lengths sim
ilar to those in their parent oxides but with the next nearest neighbor cat
ion-cation distances varying considerably from site to site. From EXAFS, th
e Y grain boundary saturation concentration is estimated to be 6.0 atoms/nm
(2), which is consistent with the estimate from STEM of 4.4 atoms/nm(2) The
differences in the Zr-O and Y-O nearest neighbor distances and coordinatio
n numbers in Al2O3 grain boundaries are related to the Y-Al and Zr-Al size
mismatches. (C) 1999 Acta Metallurgica Inc. Published by Elsevier Science L
td. All rights reserved.