Bb. Garcia et al., Transient deformation measurement with electronic speckle pattern interferometry by use of a holographic optical element for spatial phase stepping, APPL OPTICS, 38(28), 1999, pp. 5944-5947
We have used a computer-generated holographic optical element (HOE) with el
ectronic speckle pattern interferometry to calculate the interference phase
corresponding to the deformation of a test object from a single TV frame.
The HOE is a modified crossed phase grating that introduces a known phase c
hange between the +/-1 diffracted orders, without being translated. The pro
gressive propagation of transient mechanical waves was measured with an rms
precision of 2 pi/30. (C) 1999 Optical Society of America.