Transient deformation measurement with electronic speckle pattern interferometry by use of a holographic optical element for spatial phase stepping

Citation
Bb. Garcia et al., Transient deformation measurement with electronic speckle pattern interferometry by use of a holographic optical element for spatial phase stepping, APPL OPTICS, 38(28), 1999, pp. 5944-5947
Citations number
13
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Optics & Acoustics
Journal title
APPLIED OPTICS
ISSN journal
00036935 → ACNP
Volume
38
Issue
28
Year of publication
1999
Pages
5944 - 5947
Database
ISI
SICI code
0003-6935(19991001)38:28<5944:TDMWES>2.0.ZU;2-M
Abstract
We have used a computer-generated holographic optical element (HOE) with el ectronic speckle pattern interferometry to calculate the interference phase corresponding to the deformation of a test object from a single TV frame. The HOE is a modified crossed phase grating that introduces a known phase c hange between the +/-1 diffracted orders, without being translated. The pro gressive propagation of transient mechanical waves was measured with an rms precision of 2 pi/30. (C) 1999 Optical Society of America.