Electron-induced crosslinking of aromatic self-assembled monolayers: Negative resists for nanolithography

Citation
W. Geyer et al., Electron-induced crosslinking of aromatic self-assembled monolayers: Negative resists for nanolithography, APPL PHYS L, 75(16), 1999, pp. 2401-2403
Citations number
18
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
APPLIED PHYSICS LETTERS
ISSN journal
00036951 → ACNP
Volume
75
Issue
16
Year of publication
1999
Pages
2401 - 2403
Database
ISI
SICI code
0003-6951(19991018)75:16<2401:ECOASM>2.0.ZU;2-0
Abstract
We have explored the interaction of self-assembled monolayers of 1,1'-biphe nyl-4-thiol (BPT) with low energy electrons. X-ray photoelectron, infrared, and near edge x-ray absorption fine structure spectroscopy showed that BPT forms well-ordered monolayers with the phenyl rings tilted similar to 15 d egrees from the surface normal. The films were exposed to 50 eV electrons a nd changes were monitored in situ. Even after high (similar to 10 mC/cm(2)) exposures, the molecules maintain their preferred orientation and remain b onded on the gold substrate. An increased etching resistance and changes in the infrared spectra imply a crosslinking between neighboring phenyl group s, which suggests that BPT can be utilized as an ultrathin negative resist. This is demonstrated by the generation of patterns in the underlying gold. (C) 1999 American Institute of Physics. [S0003-6951(99)03640-2].