Conductance spikes in single-walled carbon nanotube field-effect transistor

Citation
K. Liu et al., Conductance spikes in single-walled carbon nanotube field-effect transistor, APPL PHYS L, 75(16), 1999, pp. 2494-2496
Citations number
17
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
APPLIED PHYSICS LETTERS
ISSN journal
00036951 → ACNP
Volume
75
Issue
16
Year of publication
1999
Pages
2494 - 2496
Database
ISI
SICI code
0003-6951(19991018)75:16<2494:CSISCN>2.0.ZU;2-0
Abstract
Nanoscale field-effect transistor (FET) has been fabricated from single-wal led carbon nanotubes (CNTs). At similar to 5 K, the transistor shows pronou nced field effect. Most interestingly, reproducible spikes are observed in the channel conductance as a function of the gate voltage. These conductanc e spikes are attributed to van Hove singularities in the electronic density of states in the carbon nanotubes. Based on the observation of these condu ctance spikes, a mechanism is proposed for the charge transport in CNT FETs . (C) 1999 American Institute of Physics. [S0003-6951(99)04039-5].