Structure determination of nanostructured Ni-Co films by anomalous x-ray scattering

Citation
Gm. Chow et al., Structure determination of nanostructured Ni-Co films by anomalous x-ray scattering, APPL PHYS L, 75(16), 1999, pp. 2503-2505
Citations number
12
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
APPLIED PHYSICS LETTERS
ISSN journal
00036951 → ACNP
Volume
75
Issue
16
Year of publication
1999
Pages
2503 - 2505
Database
ISI
SICI code
0003-6951(19991018)75:16<2503:SDONNF>2.0.ZU;2-4
Abstract
Conventional x-ray diffraction failed to provide correct information on all oying of materials made of elements with close lattice parameters, even for elements commonly accepted to have miscibility. Using anomalous x-ray scat tering, we showed that nanostructured NiCo films did not necessarily form s olid solution as expected from their phase diagram or suggested by the resu lts of conventional x-ray diffraction. (C) 1999 American Institute of Physi cs. [S0003-6951(99)02542-5].