Te. Tsai et al., Stress-dependent growth kinetics of ultraviolet-induced refractive index change and defect centers in highly Ge-doped SiO2 core fibers, APPL PHYS L, 75(15), 1999, pp. 2178-2180
The evolution of the index change of type-IIa gratings observed in 28 mol %
Ge-SiO2 core fibers with 1.8 mu m core diameter under various strains was
measured from the optical spectra, and the induced defects at high and low
strains were studied with electron spin resonance. Data will be presented t
o show that the index modulation (Delta n(mod)) of type-IIa gratings is lik
ely associated with Ge E-' centers. (C) 1999 American Institute of Physics.
[S0003-6951(99)04141-8].