Ellipsometric spectra and optical constants of PLZT thin films

Lead lanthanum zirconate titanate (PLZT) amorphous films with composition 9 /65/35 were prepared by the sol-gel technique. The ellipsometric spectra of the PLZT films on Si substrates were measured in the wavelength range of 2 00-700nm. By analyzing the ellipsometric spectra, the optical constant (ref ractive index n and extinction coefficient k) spectra of the PLZT amorphous films were obtained. We also measured the ellipsometric spectra of PLZT ce ramics with the same composition and compared the results of the amorphous films with those of the ceramics. In comparison with the ceramics, the abso rption edge of the PLZT amorphous films was found to be at a shorter wavele ngth.