Microstructural characterization of ferroelectric Pb(Sc0.5Ta0.5)O-3 ceramics

Authors
Xiong, ZX Baba-Kishi, KZ Shin, FG Lu, SG
Citation
Zx. Xiong et al., Microstructural characterization of ferroelectric Pb(Sc0.5Ta0.5)O-3 ceramics, FERROELECTR, 229(1-4), 1999, pp. 153-158
Citations number
10
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
FERROELECTRICS
ISSN journal
00150193 → ACNP
Volume
229
Issue
1-4
Year of publication
1999
Pages
153 - 158
Database
ISI
SICI code
0015-0193(1999)229:1-4<153:MCOFPC>2.0.ZU;2-N
Abstract
To more fully understand the relaxer ferroelectric PST, i.e., Pb(Sc0.5Ta0.5 )O-3, the relationship between dielectric properties and some microstructur al characteristics were studied. These include the use of electron microsco py (SEM and TEM) and X-ray microanalysis to study intergranular inclusion. Significant structural and chemical variations were found in Pb-rich sphero ids. In addition using fractal theory, fractal dimensions, D, of the cerami c grain boundaries were obtained, by image processing techniques. It was fo und that D could be successfully related to grain boundary configuration, w hich can be related to the dielectric properties.