C. Merz et al., TEMPERATURE-DEPENDENCE OF EXCITONIC PHOTOLUMINESCENCE AND RESIDUAL SHALLOW DONORS IN HIGH-PURITY GAN AL2O3/, Materials science & engineering. B, Solid-state materials for advanced technology, 43(1-3), 1997, pp. 176-180
The temperature dependence of free and bound exciton lines in high-pur
ity, undoped wurtzite GaN layers has been studied by photoluminescence
(PL) between 2 and 300 K. Below 30 K the neutral donor bound exciton
D degrees X produces the strongest near band gay PL signal whereas fre
e A and B excitons dominate the spectrum at room temperature. A deconv
olution of the asymmetric D degrees X line shape provides strong evide
nce for two residual shallow donors differing in ionisation energies b
y a factor of 1.5. The origin of a PL line occurring at E-g = 116 meV
is discussed in two alternative models. (C) 1997 Elsevier Science S.A.