TEMPERATURE-DEPENDENCE OF EXCITONIC PHOTOLUMINESCENCE AND RESIDUAL SHALLOW DONORS IN HIGH-PURITY GAN AL2O3/

Citation
C. Merz et al., TEMPERATURE-DEPENDENCE OF EXCITONIC PHOTOLUMINESCENCE AND RESIDUAL SHALLOW DONORS IN HIGH-PURITY GAN AL2O3/, Materials science & engineering. B, Solid-state materials for advanced technology, 43(1-3), 1997, pp. 176-180
Citations number
18
Categorie Soggetti
Material Science","Physics, Condensed Matter
ISSN journal
09215107
Volume
43
Issue
1-3
Year of publication
1997
Pages
176 - 180
Database
ISI
SICI code
0921-5107(1997)43:1-3<176:TOEPAR>2.0.ZU;2-Y
Abstract
The temperature dependence of free and bound exciton lines in high-pur ity, undoped wurtzite GaN layers has been studied by photoluminescence (PL) between 2 and 300 K. Below 30 K the neutral donor bound exciton D degrees X produces the strongest near band gay PL signal whereas fre e A and B excitons dominate the spectrum at room temperature. A deconv olution of the asymmetric D degrees X line shape provides strong evide nce for two residual shallow donors differing in ionisation energies b y a factor of 1.5. The origin of a PL line occurring at E-g = 116 meV is discussed in two alternative models. (C) 1997 Elsevier Science S.A.