Jp. Bergman et al., ELECTRON-GAS IN MODULATION-DOPED GAN ALGAN STRUCTURES/, Materials science & engineering. B, Solid-state materials for advanced technology, 43(1-3), 1997, pp. 207-210
We report low temperature photoluminescence (PL), time resolved PL and
electrical transport measurements related to the two-dimensional elec
tron gas (2DEG) in GaN/AlGaN heterostructures and quantum wells grown
by MOVPE on sapphire. Electrical measurements of the heterostructure s
amples show a room temperature mobility of up to 1300 cm(2) V-1 s(-1)
and carrier concentration of 10(13) cm(-2). The Pt, spectrum at low te
mperatures shows a broad emission about 50 meV below the bulk exciton
emission, attributed to recombination involving electrons from the low
est subband of the 2DEG at the GaN/AlGaN heterointerface and photoexci
ted holes in the GaN layer. The data agrees with a self consistent cal
culation of the energy levels and the electron concentration at the in
terface. The modulation doped GaN/AlGaN quantum well had an electron c
oncentration of 3.0 x 10(12) cm(-3) and a mobility of 850 cm(2) V-1 s(
-1) at 300 K. In the low temperature PL spectra we observed three well
defined peaks, at 3.53, 3.58 and 3.62 eV, which we attribute to recom
bination processes in the quantum well (QW). (C) 1997 Elsevier Science
S.A.