F. Li et Py. Woo, The invariance of node-voltage sensitivity sequence and its application ina unified fault detection dictionary method, IEEE CIRC-I, 46(10), 1999, pp. 1222-1227
Citations number
8
Categorie Soggetti
Eletrical & Eletronics Engineeing
Journal title
IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS I-FUNDAMENTAL THEORY AND APPLICATIONS
This paper proposes and proves an important theorem and its corollary for l
inear analog circuits, i,e,, the invariance of the node-voltage sensitivity
sequence and the invariance of the node-voltage change sequence. Based on
them, a unified fault detection dictionary method for both hard and soft fa
ults in analog circuits is proposed. This method uses only one fault charac
teristic code to detect any hard or soft fault of any component. In additio
n, the size of the dictionary is only one half of that of the original hard
fault dictionary.