The invariance of node-voltage sensitivity sequence and its application ina unified fault detection dictionary method

Authors
Citation
F. Li et Py. Woo, The invariance of node-voltage sensitivity sequence and its application ina unified fault detection dictionary method, IEEE CIRC-I, 46(10), 1999, pp. 1222-1227
Citations number
8
Categorie Soggetti
Eletrical & Eletronics Engineeing
Journal title
IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS I-FUNDAMENTAL THEORY AND APPLICATIONS
ISSN journal
10577122 → ACNP
Volume
46
Issue
10
Year of publication
1999
Pages
1222 - 1227
Database
ISI
SICI code
1057-7122(199910)46:10<1222:TIONSS>2.0.ZU;2-S
Abstract
This paper proposes and proves an important theorem and its corollary for l inear analog circuits, i,e,, the invariance of the node-voltage sensitivity sequence and the invariance of the node-voltage change sequence. Based on them, a unified fault detection dictionary method for both hard and soft fa ults in analog circuits is proposed. This method uses only one fault charac teristic code to detect any hard or soft fault of any component. In additio n, the size of the dictionary is only one half of that of the original hard fault dictionary.