In-situ investigation of patterned magnetic domain structures using magnetic force microscope

A novel method for in-situ investigation of patterned magnetic domain struc tures is presented. Micron-length scales of permalloy thin film fabricated by a lift-off process using electron beam lithography were placed on the to p and adjacent to an Aluminum strip. A magnetic force microscope was used t o take continuous images of the patterned permalloy films while an electric al current was applied in the aluminum strip, with which a magnetic field w as established through the patterned permalloy films in the perpendicular a nd plane direction. As a result, changes of the magnetic domain structures were observed in the presence of the applied magnetic field.