Easy axis orientation mapping and application to the development of MR films

Authors
Imagawa, T Tajima, Y Mitsuoka, K
Citation
T. Imagawa et al., Easy axis orientation mapping and application to the development of MR films, IEEE MAGNET, 35(5), 1999, pp. 3949-3951
Citations number
3
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
IEEE TRANSACTIONS ON MAGNETICS
ISSN journal
00189464 → ACNP
Volume
35
Issue
5
Year of publication
1999
Part
2
Pages
3949 - 3951
Database
ISI
SICI code
0018-9464(199909)35:5<3949:EAOMAA>2.0.ZU;2-6
Abstract
Easy axis orientation (EAO) measurement should be convenient way to charact erize magnetic films for MR heads. However, the practical application was l imited because of the complexity of EAO measurements. Here we clarify the E AO measurement condition by calculation and experiments. Then we show an ex ample of EAO application to the development of MR films and identify an imp ortant parameter for wafer production.