Comparison of magnetic images using point and thin-film magnetic force microscopy tips

The magnetic images of a magnetic reference sample were compared using poin t and thin-film magnetic force microscopy (MFM) tips, The thin film MFM tip was made by magnetron sputtering of an amorphous metal. The point MFM tip was made by an ion milling process that produces a small magnetic particle on the cantilever, Our results clearly demonstrated that the volume of magn etic material involved in the tip-sample interaction is much reduced in the case of the point tip than in that of the thin film tips. By comparing the magnetic images of a tri-bit pattern on a magnetic reference sample, we ob served an improved resolution using a point MFM tip.