Effect of Cr sub-seed layer thickness on the crystallographic orientation of co-alloy recording media on glass

Authors
Chen, QX Yen, E Chen, JP Ristau, R Ranjan, R
Citation
Qx. Chen et al., Effect of Cr sub-seed layer thickness on the crystallographic orientation of co-alloy recording media on glass, IEEE MAGNET, 35(5), 1999, pp. 2637-2639
Citations number
10
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
IEEE TRANSACTIONS ON MAGNETICS
ISSN journal
00189464 → ACNP
Volume
35
Issue
5
Year of publication
1999
Part
1
Pages
2637 - 2639
Database
ISI
SICI code
0018-9464(199909)35:5<2637:EOCSLT>2.0.ZU;2-C
Abstract
Films with Cr sub-seed layer/NiAl/Cr-alloy/Co-alloy structure were sputter- deposited on surface-oxidized NiP layers on glass substrates. The effects o f Cr sub-seed layer thickness on crystallographic orientation, grain size d istribution, magnetic properties and recording performance were investigate d. The recording performance of uni-crystal and bi-crystal media is compare d and its correlation with grain size is discussed.