An accelerated test for cobalt migration in thin-film rigid disks

Authors
Lin, MS Tsai, C Sun, Y Huang, W Wang, CM Dong, C
Citation
Ms. Lin et al., An accelerated test for cobalt migration in thin-film rigid disks, IEEE MAGNET, 35(5), 1999, pp. 2703-2705
Citations number
3
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
IEEE TRANSACTIONS ON MAGNETICS
ISSN journal
00189464 → ACNP
Volume
35
Issue
5
Year of publication
1999
Part
1
Pages
2703 - 2705
Database
ISI
SICI code
0018-9464(199909)35:5<2703:AATFCM>2.0.ZU;2-B
Abstract
An accelerated direct extraction test was developed to evaluate the cobalt migration in thin film rigid disk. The results obtained using this test sho w good correlation to the results from the conventional chamber exposure te st at 60 degrees C, 70 degrees C, and 80 degrees C with 80% RH for 96 hours .