This work presents the first generalized circuit macro-model for a pinned S
pin-Dependent-Tunneling (SDT) device. The macro-model is realized as a four
terminal subcircuit which emulates SDT device behavior over a wide range o
f sense and word line currents. This model accurately represents the nonlin
ear and hysteretic nature of an SDT device and HSPICE(TM) simulations of me
mory circuits using this model show expected outcomes. The model is flexibl
e and relatively simple: ranges of the write /read currents and device resi
stance values are incorporated as parameterized variables and no semiconduc
tor devices are used within the model.