Exchange bias: Interface imperfections and temperature dependence

Authors
Kim, JV Wee, L Stamps, RL Street, R
Citation
Jv. Kim et al., Exchange bias: Interface imperfections and temperature dependence, IEEE MAGNET, 35(5), 1999, pp. 2994-2997
Citations number
10
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
IEEE TRANSACTIONS ON MAGNETICS
ISSN journal
00189464 → ACNP
Volume
35
Issue
5
Year of publication
1999
Part
1
Pages
2994 - 2997
Database
ISI
SICI code
0018-9464(199909)35:5<2994:EBIIAT>2.0.ZU;2-V
Abstract
Calculations are presented showing how exchange bias in antiferromagnet/fer romagnet bilayers can be modified by interface roughness, Effects of steps and line defects are explored for compensated and uncompensated antiferroma gnetic interfaces. The angular dependence of the bias field on orientation and interface structure is calculated, and thermal effects related to stabi lity are discussed.