S. Singh et al., Identification of amplified fragment length polymorphism markers associated with Karnal bunt (Neovossia indica) resistance in bread wheat, I J AGR SCI, 69(7), 1999, pp. 497-501
Amplified fragment length polymorphism markers were used to study polymorph
ism and their association with Karnal bunt resistance genes in wheat (Triti
cum aestivum L. emend. Fiori & Paoi.). Recombinant inbred lines developed f
rom a cross of a Karnal bunt susceptible 'WL 711' and a Karnal-bunt resista
nt line 'HD 29' were tested for resistance to 2 Karnal bunt isolates throug
h artificial inoculations. Study of parents and a set of recombinant inbred
lines (selected on the basis of Karnal bunt reaction) for amplified fragme
nt length polymorphism with 6 primer combinations were analyzed and 336 loc
i scored. Of these, 77 were polymorphic between the parents. Three of the p
olymorphic markers were associated with Karnal bunt resistance genes.