A magneto-optical proximate analyzer of the quality of high-temperature superconductor films

Citation
Ea. Protasov et Os. Yesikov, A magneto-optical proximate analyzer of the quality of high-temperature superconductor films, INSTR EXP R, 42(5), 1999, pp. 731-733
Citations number
5
Categorie Soggetti
Instrumentation & Measurement
Journal title
INSTRUMENTS AND EXPERIMENTAL TECHNIQUES
ISSN journal
00204412 → ACNP
Volume
42
Issue
5
Year of publication
1999
Pages
731 - 733
Database
ISI
SICI code
0020-4412(199909/10)42:5<731:AMPAOT>2.0.ZU;2-#
Abstract
The device described is designed for the proximate analysis of the quality of high-temperature superconductor (HTSC) films and for studies of magnetic fields with intensities of up to 100 Oe. The device makes it possible to m easure microdefects and local inhomogeneities of high-temperature supercond uctors by the magneto-optical technique with a resolution of similar to 600 cm(-1), and also to determine their parameters (the critical temperature a nd first critical magnetic field).