Quantitative texture analysis of small domains with synchrotron radiation X-rays

Citation
F. Heidelbach et al., Quantitative texture analysis of small domains with synchrotron radiation X-rays, J APPL CRYS, 32, 1999, pp. 841-849
Citations number
30
Categorie Soggetti
Physical Chemistry/Chemical Physics
Journal title
JOURNAL OF APPLIED CRYSTALLOGRAPHY
ISSN journal
00218898 → ACNP
Volume
32
Year of publication
1999
Part
5
Pages
841 - 849
Database
ISI
SICI code
0021-8898(19991001)32:<841:QTAOSD>2.0.ZU;2-J
Abstract
Quantitative analysis of crystallographic preferred orientation (texture) o f very small volumes in fine-grained polycrystalline materials has been car ried out with a monochromatic X-ray microbeam (less than or equal to 30 mu m) at the microfocus beamline of the European Synchrotron Radiation Facilit y (ESRF). The experimental procedure is described and illustrated with text ures of rolled aluminium, aluminium and steel wires, polymer fibers and nat ural bone material (apatite).