The coherent electron microdiffraction of a single translation domain boundary in beta-Ni3Nb phase

Authors
Pan, HY Du, K Wang, YM Zhu, J Li, SY Ye, HQ
Citation
Hy. Pan et al., The coherent electron microdiffraction of a single translation domain boundary in beta-Ni3Nb phase, J APPL CRYS, 32, 1999, pp. 951-955
Citations number
11
Categorie Soggetti
Physical Chemistry/Chemical Physics
Journal title
JOURNAL OF APPLIED CRYSTALLOGRAPHY
ISSN journal
00218898 → ACNP
Volume
32
Year of publication
1999
Part
5
Pages
951 - 955
Database
ISI
SICI code
0021-8898(19991001)32:<951:TCEMOA>2.0.ZU;2-4
Abstract
The microdiffraction from a single translation domain boundary (TDB) in bet a-Ni3Nb has been recorded by using a Hitachi HF-2000 field emission gun tra nsmission electron microscope, while high-resolution transmission electron microscopy images were used to assist the analysis. The diffraction splitti ng effect of a TDB is well explained by the kinematics and dynamic calculat ions, and complex diffraction characteristics have been studied by using dy namics simulation.