Influence of the device package on the results of charged device model (CDM) tests - consequences for tester characterization and test procedure

The results of charged device model (CDM) device level tests - opposite to socketed device model (SDM) - are strongly influenced by the device package s. An investigation on different types of devices (technology and package) shows that the CDM withstand voltage depends on the peak current of the dis charge current waveform and not on the charge which is stored on the device after charging. This information has important consequences on tester char acterization and the test procedure. Moreover, peak current investigation g ives a chance to extrapolate CDM results from one specific package to other packages and even perhaps for SDM/CDM correlation. (C) 1999 Elsevier Scien ce B.V. All rights reserved.