Structural characterization of BDN-SOH LB films using small angle XRD and Fourier transform IR spectroscopy

Citation
Dq. Yang et al., Structural characterization of BDN-SOH LB films using small angle XRD and Fourier transform IR spectroscopy, J MATER SCI, 34(22), 1999, pp. 5569-5574
Citations number
26
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
JOURNAL OF MATERIALS SCIENCE
ISSN journal
00222461 → ACNP
Volume
34
Issue
22
Year of publication
1999
Pages
5569 - 5574
Database
ISI
SICI code
0022-2461(199911)34:22<5569:SCOBLF>2.0.ZU;2-#
Abstract
We investigated the structure of BDN(bis(4-diethylaminodithiobenzil) Nickel )-SOH(Stearyl alcohol) Langmuir-Blodgett films using small angle X-ray diff raction and polarized FTIR spectroscopy. The results show that the microcry stal domains formed on the surface of LB film resemble a well-laminated per iodic structure with a molecular spacing of 2.56 nm. Meanwhile, the tilted angles of the molecules of SOH and BDN are about 30 degrees, referring to t he normal direction of the sample surface, as determined by our XRD and FTI R studies. (C) 1999 Kluwer Academic Publishers.