Complete analytical solutions of film planarization during spin coating

Authors
Citation
Py. Wu et Fc. Chou, Complete analytical solutions of film planarization during spin coating, J ELCHEM SO, 146(10), 1999, pp. 3819-3826
Citations number
20
Categorie Soggetti
Physical Chemistry/Chemical Physics","Material Science & Engineering
Journal title
JOURNAL OF THE ELECTROCHEMICAL SOCIETY
ISSN journal
00134651 → ACNP
Volume
146
Issue
10
Year of publication
1999
Pages
3819 - 3826
Database
ISI
SICI code
0013-4651(199910)146:10<3819:CASOFP>2.0.ZU;2-U
Abstract
To offer a simple set of equations to designers and researchers for describ ing the degree of planarization (DOP), a first complete analytical solution of film planarization during spin coating is presented. The analytical sol utions are suitable for an isolated feature and periodic features in the wh ole range of Omega(2). The governing dimensionless parameter Omega(2) repre sents the ratio of centrifugal force to surface tension force during spin c oating. For Omega(2) --> 0, surface tension is infinite, and the film is pl anar. For Omega(2) --> infinity, surface tension is zero, and the film is a lways conformal, with an equal thickness everywhere. The analytical solutio ns agree with the existing experiment data and numerical solutions. A compa rison shows that the degree of planarization for an isolated trench is high er than that for an isolated ridge in the range of 10(-5) < Omega(2) < 3 x 10(1), but they gradually become identical and independent of d/h(f) for Om ega(2) > 3 x 10(1) and Omega(2) < 10(-5). For periodic features, DOPP is in dependent of dimensionless film thickness, d/h(f), dimensionless line spaci ng, alpha, and Omega(2) in the range of Omega(2) > 3 x 10(2) and Omega(2) < 10(-2) (C) 1999 The Electrochemical Society. S0013-4651(99)01-014-9. All ri ghts reserved.