Control of spatial and transient temperature trajectories for photoresist processing

Citation
K. El-awady et al., Control of spatial and transient temperature trajectories for photoresist processing, J VAC SCI B, 17(5), 1999, pp. 2109-2114
Citations number
14
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B
ISSN journal
10711023 → ACNP
Volume
17
Issue
5
Year of publication
1999
Pages
2109 - 2114
Database
ISI
SICI code
1071-1023(199909/10)17:5<2109:COSATT>2.0.ZU;2-6
Abstract
wSpatial and transient control of temperature trajectories by a new thermal cycling module is presented, with a focus on photoresist processing applic ations for semiconductor wafers and quartz reticles. In the proposed unit, the bake and chill steps are conducted sequentially within the same module without any substrate movement. The unit includes two heating sources. The first is a circulating fluid which can be switched between hot and cold res ervoirs and serves as the dominant means for heat transfer. The second is a set of thermoelectric devices which are used to provide a distributed amou nt of heat to the substrate for uniformity and transient temperature contro l. Experimental data is provided to demonstrate temperature uniformity duri ng both transient and steady state operation. The flexibility of the system to develop new processing temperature trajectories is presented. (C) 1999 American Vacuum Society.