Spin-on Cu films for ultralarge scale integrated metallization

Citation
H. Murakami et al., Spin-on Cu films for ultralarge scale integrated metallization, J VAC SCI B, 17(5), 1999, pp. 2321-2324
Citations number
7
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B
ISSN journal
10711023 → ACNP
Volume
17
Issue
5
Year of publication
1999
Pages
2321 - 2324
Database
ISI
SICI code
1071-1023(199909/10)17:5<2321:SCFFUS>2.0.ZU;2-Q
Abstract
We have developed the spin-on Cu metal (SOM) process to fill trenches and v ias down to 0.3 mu m. SOM is a liquid material that contains an organic sol vent and dispersed ultrafine particles as a source of Cu. This solution was applied to a Si wafer using a spin coater to form a film. Coated wafers we re baked at 623-673 K for 10 min in a reducing atmosphere. The end result i s a Cu film. Contrary to the conventional deposition techniques, the SOM pr ocess is simple but advantageous to its gap filling, planarization, and cos t consideration. (C) 1999 American Vacuum Society. [S0734-211X(99)05405-0].