Growth and properties of CdSe thin films by a new process of electrochemical selenization of Cd metal layers

Citation
Ac. Rastogi et al., Growth and properties of CdSe thin films by a new process of electrochemical selenization of Cd metal layers, MATER RES B, 34(8), 1999, pp. 1319-1332
Citations number
26
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
MATERIALS RESEARCH BULLETIN
ISSN journal
00255408 → ACNP
Volume
34
Issue
8
Year of publication
1999
Pages
1319 - 1332
Database
ISI
SICI code
0025-5408(199906)34:8<1319:GAPOCT>2.0.ZU;2-S
Abstract
Growth and properties of cadmium selenide semiconductor thin films prepared by a new electrochemical selenization process (ECS) are described. The as- formed CdSe thin films have large (similar to 1 mu m) crystallites in hexag onal modification. The differential selenization kinetics in the intra- and intergrain regions causes the formation of stoichiometric CdSe film to be highly dependent on time. CdSe composition is independent of selenization p arameters. Two direct optical band gaps at 2.09 and 1.44 eV, as opposed to a single gap at 1.7 eV, are observed in CdSe film selenized at 0.6 and 0.4 mA/cm(2) current densities, respectively. A mechanism of selenization based on Cd ionization by oxygen reduction and reaction with cathodically releas ed Se ions is proposed for the CdSe film formation. (C) 1999 Elsevier Scien ce Ltd.