Probing photoinduced charge transfer at atomically smooth metal surfaces using surface enhanced Raman scattering

Citation
P. Kambhampati et al., Probing photoinduced charge transfer at atomically smooth metal surfaces using surface enhanced Raman scattering, PHYS ST S-A, 175(1), 1999, pp. 233-239
Citations number
13
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
PHYSICA STATUS SOLIDI A-APPLIED RESEARCH
ISSN journal
00318965 → ACNP
Volume
175
Issue
1
Year of publication
1999
Pages
233 - 239
Database
ISI
SICI code
0031-8965(19990916)175:1<233:PPCTAA>2.0.ZU;2-O
Abstract
The chemical mechanism of surface enhanced Raman scattering (SERS) is used as a probe of photoinduced charge transfer at atomically smooth, single cry stal copper and silver surfaces in ultrahigh vacuum. The combination of SER S with electron energy loss spectroscopy (EELS) provides a great deal of in sight into the spatial extent, transition moment, and excited state potenti al energy surfaces of these excitations. These experiments and simulations are demonstrated to be: sensitive probes of local electronic structure at m etal surfaces.