Image formation in second-harmonic near-field microscopy

Citation
Si. Bozhevolnyi et al., Image formation in second-harmonic near-field microscopy, PHYS ST S-A, 175(1), 1999, pp. 331-336
Citations number
10
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
PHYSICA STATUS SOLIDI A-APPLIED RESEARCH
ISSN journal
00318965 → ACNP
Volume
175
Issue
1
Year of publication
1999
Pages
331 - 336
Database
ISI
SICI code
0031-8965(19990916)175:1<331:IFISNM>2.0.ZU;2-A
Abstract
A macroscopic self-consistent approach that enables one to rigorously descr ibe image formation in scanning near-field optical second-harmonic generati on microscopy is developed. The self-consistent second-harmonic field is de termined by taking into account both the linear and nonlinear contributions in the effective current, i.e., the currents generated by the self-consist ent fields at the fundamental and second-harmonic frequencies. The self-con sistent problem for both frequencies is solved exactly by use of the diagra m technique adapted from quantum electrodynamics. Preliminary numerical res ults calculated for a rectangular object are presented and compared with ex perimental observations. It is demonstrated that the optical contrast and t he spatial resolution are significantly better in the second-harmonic image s than in the images obtained at the fundamental frequency.