L. Seve et al., Profile of the induced 5d magnetic moments in Ce/Fe and La/Fe multilayers probed by x-ray magnetic-resonant scattering, PHYS REV B, 60(13), 1999, pp. 9662-9674
The element and electronic shell selectivity of x-ray resonant magnetic sca
ttering (XRMS) has been used to investigate the profile of the spin polariz
ation of the 5d electronic states of Ce and La across the rare-earth layers
in Ce/Fe and La/Fe multilayers. The magnetic contributions to the diffract
ed intensities have been measured at low angles, at the L-2 edge of the rar
e earth. In agreement with previous results from x-ray magnetic circular di
chroism (XMCD) experiments, the La 5d polarization is found to be localized
right at the interfaces with the Fe layers, as it is expected from a direc
t hybridization with the Fe 3d states. In the case of Ce/Fe multilayers whe
re Ce is in an ar-like electronic state with a complex behavior of the 5d m
agnetic polarization, the XRMS results obtained for two samples with 10 and
22 Angstrom thick Ce layers indicate that the Ce 5d polarization decreases
slowly from the interfaces towards the center of the layers. This is in ag
reement with previous XMCD results. However, at least for the two samples w
hich have been investigated, XRMS also suggests that the Ce 5d polarization
oscillates across the Ce layer with a period equal to the (111) interplana
r distance in alpha fcc Ce. Though compatible with the XMCD findings, this
oscillating behavior cannot be derived from its dependence on the Ce layer
thickness because of the decrease of the magnetic polarization which preven
ts us from observing changes in the sign of the XMCD amplitude. [S0163-1879
(99)04637-8].