Carrier thermal escape and retrapping in self-assembled quantum dots

Citation
S. Sanguinetti et al., Carrier thermal escape and retrapping in self-assembled quantum dots, PHYS REV B, 60(11), 1999, pp. 8276-8283
Citations number
25
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
PHYSICAL REVIEW B-CONDENSED MATTER
ISSN journal
01631829 → ACNP
Volume
60
Issue
11
Year of publication
1999
Pages
8276 - 8283
Database
ISI
SICI code
0163-1829(19990915)60:11<8276:CTEARI>2.0.ZU;2-K
Abstract
The effects of carrier thermal escape and retrapping on the temperature dep endence of the photoluminescence of InAs/GaAs self-assembled quantum dots a re investigated. A systematic experimental study of the temperature evoluti on of the photoluminescence spectra in two different sets of samples is rep orted. The photoluminescence behavior is well reproduced in terms of a stea dy state model for the carrier dynamics which takes into account the quantu m-dot size distribution, random population effects, and carrier capture, re laxation, and retrapping. The relative contributions of these processes to the photoluminescence thermal quenching is discussed.