Identifying molecular orientation of individual C-60 on a Si(111)-(7 x 7) surface

Authors
Hou, JG Yang, JL Wang, HQ Li, QX Zeng, CG Lin, H Bing, W Chen, DM Zhu, QS
Citation
Jg. Hou et al., Identifying molecular orientation of individual C-60 on a Si(111)-(7 x 7) surface, PHYS REV L, 83(15), 1999, pp. 3001-3004
Citations number
13
Categorie Soggetti
Physics
Journal title
PHYSICAL REVIEW LETTERS
ISSN journal
00319007 → ACNP
Volume
83
Issue
15
Year of publication
1999
Pages
3001 - 3004
Database
ISI
SICI code
0031-9007(19991011)83:15<3001:IMOOIC>2.0.ZU;2-0
Abstract
Low temperature scanning tunneling microscopy (STM) has been used to identi fy the molecular orientation of individual C-60 on Si(111)-(7 X 7) surfaces . The STM images of individual C-60 reveal clear and rich intramolecular fe atures that are site and bias dependent. Theoretical simulations, using the local density approximation method with cluster models, uniquely reproduce the observed STM images and hence allow the unambiguous identification of the binding configurations of the adsorbed fullerenes with respect to the S i substrate.