Depth profiling of UV cured coatings containing photostabilizers by confocal Raman microscopy

Authors
Schrof, W Beck, E Koniger, R Reich, W Schwalm, R
Citation
W. Schrof et al., Depth profiling of UV cured coatings containing photostabilizers by confocal Raman microscopy, PROG ORG C, 35(1-4), 1999, pp. 197-204
Citations number
11
Categorie Soggetti
Material Science & Engineering
Journal title
PROGRESS IN ORGANIC COATINGS
ISSN journal
03009440 → ACNP
Volume
35
Issue
1-4
Year of publication
1999
Pages
197 - 204
Database
ISI
SICI code
0300-9440(199908)35:1-4<197:DPOUCC>2.0.ZU;2-V
Abstract
The chemical imaging possibility of confocal Raman microscopy was used to c haracterize UV cured coatings layers. Depth profiles of acrylate curing con version were recorded in order to elucidate the interaction of photoinitato r, photostabilizer, and irradiation source. Formulations containing acyl ph osphine oxides resulted in a better through cure. (C) 1999 Elsevier Science S.A. All rights reserved.