The luminescence properties of In doped GaSb single crystals have been stud
ied by the cathodoluminescence (CL) technique in the scanning electron micr
oscope. It has been found that indium induces a certain reduction on the na
tive acceptor concentration in contrast to what occurs with other isoelectr
onic dopants (e.g. aluminium). Large In concentrations lead to the formatio
n of the ternary compound InxGa1-xSb as revealed by CL spectra and x-ray me
asurements. In particular, a luminescence band and x-ray diffraction peaks
observed in highly doped samples are attributed to the presence of InxGa1-x
Sb.