X-ray scattering measurements on nanosized TiO2 micelles

Citation
A. Turkovic et al., X-ray scattering measurements on nanosized TiO2 micelles, SOL EN MAT, 59(4), 1999, pp. 387-392
Citations number
20
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
SOLAR ENERGY MATERIALS AND SOLAR CELLS
ISSN journal
09270248 → ACNP
Volume
59
Issue
4
Year of publication
1999
Pages
387 - 392
Database
ISI
SICI code
0927-0248(199911)59:4<387:XSMONT>2.0.ZU;2-N
Abstract
Titanium dioxide, micelles on glass substrate were generated in situ in a w ater-in-oil (w/o) microemulsion composed of water, dioctyl sulfosuccinate s odium salt (AOT), and cyclohexane, by controlled hydrolysis of TiCl4. The a verage grain size [R], obtained by grazing-incidence small-angle X-ray scat tering (GISAXS), was 6.3 +/- 0.8 nm. "Corrected specific surface" of TiO2 m icelles was determined as 5.0 x 10(5) cm(-1). The average grain size [R] of 5.0 +/- 1.3 nm obtained by grazing-incidence wide-angle X-ray scattering ( GIWAXS) agrees with GISAXS value. GIWAXS can detect smaller amounts of addi tional phases or impurities than classical X-ray diffraction equipment. (C) 1999 Elsevier Science B.V. All rights reserved.