The effect of the ratios of the cationic components and internal strains on
the critical temperature T-c and the dielectric characteristics of BSTO fe
rroelectric films grown on alpha-Al2O3 [10 (1) under bar 2] and LaAlO3 subs
trates were investigated. Ion backscattering diagnostics revealed a barium
deficiency in the surface layer of the films and showed that the films diff
er in structural quality. (C) 1999 American Institute of Physics.