Ib. Ermolovich et al., Nature of the transitional region during the deposition of titanium borideand nitride films on gallium arsenide, TECH PHYS L, 25(10), 1999, pp. 789-791
Photoluminescence and x-ray photoelectron spectroscopy methods were used to
analyze the compositions of the near-junction regions of titanium boride (
nitride)-gallium arsenide heterostructures. Data have been obtained for the
first time on the formation of GaxB1-xAs and GaAsxN1-x solid solutions, wh
ich play an important role in the formation of the properties and the therm
al stability of the experimental structures on the interphase boundary of t
hese structures. (C) 1999 American Institute of Physics.