A RELIABLE METHOD FOR EXTRACTION OF MATERIAL PARAMETERS IN TERAHERTZ TIME-DOMAIN SPECTROSCOPY

This paper introduces a never method that allows fast and reliable ext raction of material parameters in terahertz time-domain spectroscopy, This method could be applied for most of materials and requires neithe r simplifying assumptions nor samples of different thickness for the e xtraction, The presented extraction procedure operates either on trunc ated terahertz signals when temporal windowing is possible, or on full ones otherwise. Some experimental examples covering all practical cas es are given, In particular, the extraction procedure treats the tedio us case of samples for which internal reflections of the terahertz pul se slightly overlap.