Measurement of the profile and the dihedral angle of grain boundary grooves by atomic force microscopy

Authors
Schollhammer, J Chang, LS Rabkin, E Baretzky, B Gust, W Mittemeijer, EJ
Citation
J. Schollhammer et al., Measurement of the profile and the dihedral angle of grain boundary grooves by atomic force microscopy, Z METALLKUN, 90(9), 1999, pp. 687-690
Citations number
18
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science",Metallurgy
Journal title
ZEITSCHRIFT FUR METALLKUNDE
ISSN journal
00443093 → ACNP
Volume
90
Issue
9
Year of publication
1999
Pages
687 - 690
Database
ISI
SICI code
0044-3093(199909)90:9<687:MOTPAT>2.0.ZU;2-W
Abstract
Grain boundary grooves of pure Cu and Cu-50 at.ppm Bi bicrystals were measu red by means of atomic force microscopy. An unprecedented accuracy was atta ined with this method. An analytical function proposed by Mullins for the g rooving process was fitted to the measured groove profile. Extrapolation of this fitted function in the groove root of the profile led to accurate val ues of the dihedral angle.