Progress in CMOS integrated measurement systems

Citation
H. Baltes et O. Brand, Progress in CMOS integrated measurement systems, IEEE AES M, 14(10), 1999, pp. 29-34
Citations number
14
Categorie Soggetti
Aereospace Engineering
Journal title
IEEE AEROSPACE AND ELECTRONIC SYSTEMS MAGAZINE
ISSN journal
08858985 → ACNP
Volume
14
Issue
10
Year of publication
1999
Pages
29 - 34
Database
ISI
SICI code
0885-8985(199910)14:10<29:PICIMS>2.0.ZU;2-M
Abstract
Selected micro- and nano-systems developed recently at the Physical Electro nics Laboratory of ETH Zurich are reviewed: (i) a fluxgate microsystem for detection of the Earth's magnetic field; (ii) a capacitive chemical sensor microsystem for detection of volatile organic compounds in air; and (iii) a parallel scanning AFM chip. The micro- and nano-systems combine sensor str uctures and read-out circuitry on a single chip and are fabricated using in dustrial CMOS technology in combination with post-processing micromachining and film deposition.