Ce. Vallet et al., RUTHERFORD BACKSCATTERING SPECTROSCOPIC STUDY OF THE FAILURE-MECHANISM OF (RUO2+TIO2) TI THIN-FILM ELECTRODES IN H2SO4 SOLUTIONS/, Journal of the Electrochemical Society, 144(4), 1997, pp. 1289-1295
RuO2-TiO2 electrodes 5000 Angstrom thick, which mimic the dimensionall
y stable anodes in composition and the method of preparation, were pre
pared and tested for their activity toward the chlorine evolution reac
tion and subjected to lifetime testing in sulfuric acid solution. Ruth
erford backscattering spectrometry was used concurrently with electroc
hemical measurements to analyze the changes in the ruthenium content o
f the coating. The decrease in electrode activity was found to be clos
ely linked to a decrease in the Ru content, and the measured profiles
indicate that the loss takes place across the thin coating. Failure is
observed for electrodes with a Ru content below the critical concentr
ation of 3 x 10(21) Ru atom/cm(3), but there is no evidence for the bu
ildup of a pure TiO2 layer.